Automated Twin Identification Technique for Use with Electron Backscatter Diffraction
نویسندگان
چکیده
منابع مشابه
Electron Backscatter Diffraction (EBSD) Technique and Materials Characterization Examples
The term “electron backscatter diffraction” (EBSD) is now synonymous with both the scanning electron microscope (SEM) technique and the accessory system that can be attached to an SEM. EBSD provides quantitative microstructural information about the crystallographic nature of metals, minerals, semiconductors, and ceramics—in fact most inorganic crystalline materials. It reveals grain size, grai...
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Electron backscatter diffraction (EBSD) originated in materials science and has transferred to biomineral research providing insight into fossil and modern biominerals. An electron microscopy technique, EBSD requires a fine polished sample surface where the electron beam diffracts in the first few lattice layers, identifying mineral, polymorph and crystallographic orientation. The technique is ...
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Electron Back-Scatter Diffraction (EBSD) is a powerful technique that captures electron diffraction patterns from crystals, constituents of material. Captured patterns can then be used to determine grain morphology, crystallographic orientation and chemistry of present phases, which provide complete characterization of microstructure and strong correlation to both properties and performance of ...
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We report the first use of direct detection for recording electron backscatter diffraction patterns. We demonstrate the following advantages of direct detection: the resolution in the patterns is such that higher order features are visible; patterns can be recorded at beam energies below those at which conventional detectors usefully operate; high precision in cross-correlation based pattern sh...
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A method for automatically aligning consecutive datasets of large, two-dimensional multi-tile electron backscatter diffraction (EBSD) scans with high accuracy was developed. The method involves first locating grain and phase boundaries within search regions containing overlapping data in adjacent scan tiles, and subsequently using cross-correlation algorithms to determine the relative position ...
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ژورنال
عنوان ژورنال: Materials Science Forum
سال: 2005
ISSN: 1662-9752
DOI: 10.4028/www.scientific.net/msf.495-497.191